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Paper / 2019SMQ / 140856596014621
Dependent Microstructure Noise and Integrated Volatility: Estimation from High-Frequency Data
econometrics / market microstructureResource overview

Dependent Microstructure Noise and Integrated Volatility: Estimation from High-Frequency Data

Paper2019

by Laeven, R. J. A., Li, Z. M., Vellekoop, M. H.

Tags
econometricsmarket microstructure

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Suggested foundations for volatility models and surfaces and financial time series. Specialist prerequisites vary by paper.

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